Taiwan Semiconductor Research Institute, NARLabs.

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Chip System
High-frequency
Nano and Power Device

To check usage guidelines or download resources, please refer to Booking System for more information.

Chip System Measurement

Location	No.	Equipment	Contact	User Self-service
Hsinchu	HF-201	Chip Photo	Ms. Chang 7192
Hsinchu	HF-202	Wire Bonder SUB668	Ms. Chang 7192	V
Hsinchu	HF-203	Laser Cutter	Ms. Chang 7192	V
Hsinchu	HF-204	Oscilloscope (Lecroy LT584)	Ms. Chang 7192
Hsinchu	HF-M01	MEMS Measurement System	Mr. Chang / Mr. Wang 7202 / 7247
Hsinchu	HF-P01	High frequency, High Speed Photonic Integrated Circuit (PIC)/ Electronic Integrated Circuit (EIC) Measurement System	Mr. Lin 7273
Hsinchu	HF-P02	Silicon Photonics Optical Measurement Systems	Mr. Zhong 7165
Hsinchu	HF-S01	Advantest V93000 PS1600 Automatic Test System	Mr. Wu 7196
Tainan	ST-201	Advanced Analog Measurement System	Mr. Wu 8107
Tainan	ST-301	Programmable Compact Temperature & Humidity System	Mr. Wu 8107
Tainan	ST-302	Al Wire Bonding	Mr. Liu 8109
Tainan	ST-303	PCB Prototyping Machine	Mr. Liu 8109
Tainan	ST-304	Chip Image Capture System	Mr. Liu 8109

High-frequency Measurement

Location	No.	Equipment	Contact	User Self-service
Hsinchu	HF-003	67GHz S-parameter Measurement System	Mr. Lin 7774	V
Hsinchu	HF-004	High Frequency Noise Pparameter Measurement System	Mr. Lin 7774	V
Hsinchu	HF-005	High Frequency Power Parameter Measurement System	Mr. Zhuang 7574	V
Hsinchu	HF-006	High-frequency Circuit Measurement System	Mr. Shen 7630	V
Hsinchu	HF-009	110GHz S-parameter Measurement System	Mr. Deng 7633
Hsinchu	HF-010	Nonlinear Vector Network Analyzer Measurement System	Mr. Zhuang 7574
Hsinchu	HF-013	Millimeter-wave Noise/Power Parameter Measurement System	Mr. Zhuang 7574
Hsinchu	HF-014	220GHz S-parameter Measurement System	Mr. Deng 7633
Hsinchu	HF-015	110GHz Harmonic Load Pull Measurement System	Mr. Qian 7650
Hsinchu	HF-101	40GHz Measurement System	Mr. Chen 7513
Hsinchu	HF-101-01	Modulation Signal Measurement System (40GHz System)	Mr. Chen 7513
Hsinchu	HF-102	67GHz Measurement System	Mr. Chen 7513
Hsinchu	HF-102-01	Modulation Signal Measurement System (67GHz System)	Mr. Chen 7513
Hsinchu	HF-103	Signal Source Parameter Measurement System	Mr. Chen 7513
Tainan	ST-101	S-parameter, X-parameter, RF IC, and Load-pull Measurement System	Mr. Hsiao 8206
Tainan	ST-102	Antenna Measurement System	Mr. Tu 8112

Nanoscale and Power Device Measurement

Location	No.	Equipment	Contact	User Self-service
Hsinchu	HF-001	Nano Device Parameter Measurement Dystem	Mr. Lin 7638,7456	V
Hsinchu	HF-007	Low Frequency Noise Measurement System	Mr. Lin 7638,7456	V
Hsinchu	HF-011	IV&CV Electrical Measurement System	Mr. Lin 7638,7456	V
Hsinchu	HF-012	Power Device Measurement System	Mr. Chen 7570,7456