TAF 17025 Testing Laboratory
We have eight measurement technologies related to material measurement and analysis that have been accredited:
AFM step height measurement, AFM line width measurement, TEM line width measurement, SEM line width measurement, SEM surface image observation, SIMS boron depth profile, X-ray diffractometer phase identification, and X-ray photoelectron spectroscopy surface qualitative analysis. The Laboratory entered into a Mutual Recognition Arrangement with the International Laboratory Accreditation Cooperation (ILAC MRA) on January 3, 2008, demonstrating that the Laboratory has international-level test capability and is at the same technical level as laboratories accredited by 67 countries and 81 accreditation bodies around the world.
AFM step height measurement, AFM line width measurement, TEM line width measurement, SEM line width measurement, SEM surface image observation, SIMS boron depth profile, X-ray diffractometer phase identification, and X-ray photoelectron spectroscopy surface qualitative analysis. The Laboratory entered into a Mutual Recognition Arrangement with the International Laboratory Accreditation Cooperation (ILAC MRA) on January 3, 2008, demonstrating that the Laboratory has international-level test capability and is at the same technical level as laboratories accredited by 67 countries and 81 accreditation bodies around the world.
Accreditation Fee
TAF-ISO17025 Crtificate Fee: Academic community: NTD5,000/certificate; industry community: NTD10,000/certificate.
Accreditation Process
Make a reservation with the contact person → Send samples for testing → Testing and measurement → Report review → Payment → Take back the samples and get the report
Point of Contact
Mr. Chou Ext. 7553 or 7424
E-mail: thchou@narlabs.org.tw
TAF Test Report Sample
(Please click the link to open the sample for use by internal staff)