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Taiwan Semiconductor Research Institute

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Home MeasurementMaterials AnalysisAdvanced Consultation
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Advanced Consultation

Purpose

The Taiwan Semiconductor Research Institute (hereinafter referred to as the TSRI) has initiated this program in order to assist professors in engaging in the development of advanced material analysis technologies. This program will further improve the academic community’s excellent material analysis services, better foster the middle- and high-level talent needed by related industries, and create a close connection between the academic and research communities, thereby sharping Taiwan’s competitive edge in analysis and testing technologies.

Point of Contact

Dr./Team Leader Kun-Lin Lin
Ext.: 7531
E-mail: kllin@niar.org.tw

Collaborative Partners

Our collaborative partners are professors and research groups in domestic public and private universities, industries, and corporations.

Collaborative Projects

Analysis Equipment
Field Emission Transmission Electron Microscopy (TEM) X-ray Diffractometer (XRD) Micro-Raman Spectroscopy (Micro-Raman)
Secondary Ion Mass Spectrometer (SIMS) Scanning Probe Microscopy (SPM) X-ray Photoelectron Spectroscopy (XPS)
Micro-Fourier Transform Infrared Spectroscopy (Micro-FTIR) Multi-mode Atomic Force Microscopy (ICON) Differential Hall Effect Metrology (DHEM)
Nanoindenter    
* Other advanced material analysis and testing technologies

Application Process

  1. Collaborative partners intending to participate in projects are required to fill out an application form (whose format is as shown in Attachment 1) for “Advanced Consulting Services for Materials Analysis” and submit it for the rolling review process.
  2. After the application is assessed and approved, there will be discussion about the project and its completion date. If the application is not approved, it will be rejected or treated like a general application (as shown in the flowchart).



Implementation

  1. Based on the collaborative projects to be implemented, researchers/engineers are appointed to discuss the projects, implementation details, and expected expenses.
  2. Analysis specimens and MES orders must be provided for commissioned analysis.



Partner Obligations

  1. After projects are completed, project results should be submitted to the SNDCT (Symposium on Nano-Device Circuits and Technologies/Material Analysis) for publication.
  2. Co-published papers should credit or acknowledge the Taiwan Semiconductor Research Institute.

Download
Application+Form+for+Advanced+Consulting+Services+for+Material+Analysis-20250401.pdf
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Customer Service:tsri-cs@niar.org.tw ext:7610
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    No.26, Prosperity Road I, Hsinchu Science Park, Hsinchu 300091, Taiwan, R.O.C.
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    TEL. +886-6-2087971FAX. +886-6-2089122
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