Equipment List
Notes：
- User Self-service or OEM Service：Please go to the Manufacturing and Measurement Analysis Service System / MES system.
- Equipment Assessment Form：Please apply through the Equipment Operation Training.
- Equipment Open Grade：Explanation.
| No. | Equipment | Introduction | Contact | Open Grade | Location |
|---|---|---|---|---|---|
| NM-002 | Veeco Dimension 5000 Scanning Probe Microscope | Download |
Ms. Jian 7577,7424 |
B2 | R221 |
| NM-005 | Ion Polishing System (PIPS) | Download |
Mr. Wu 7682,7408 |
B2 | R203 |
| NM-006 | Field Emission Transmission Electron Microscopy (TEM) | Download |
Mr. Wu 7682,7425 |
B3 | R229 |
| NM-008 | X-ray Diffractometer (XRD) | Download |
Ms. Huang 7773,7409 |
B2 | R204 |
| NM-009 | Thermal Field Emission Scanning Electron Microscopy (TFSEM) | Download |
Ms. Hsu 7751,7489 |
B2 | R215 |
| NM-013 | Secondary Ion Mass Spectrometer (SIMS) | Download |
Mr. Huang 7561,7423 |
B4 | R215 |
| NM-014 | Veeco Dimension 3100 Scanning Probe Microscope | Download |
Mr. Chou 7496,7553 |
B2 | R221 |
| NM-015 | X-ray Photoelectron Spectroscopy (XPS) | Download |
Mr. Yu 7528,7423 |
B4 | R215 |
| NM-016 | Micro-Fourier Transform Infrared Spectroscopy (Micro-FTIR) | Download |
Mr. Yang 7726 |
B2 | R221 |
| NM-017 | Bruker Dimension Icon Scanning Probe Microscope | Download |
Ms. Jian 7577,7424 |
B3 | R221 |
| NM-018 | Differential Hall Effect Metrology (DHEM) | Download |
Mr. Chang 7502,7489 |
B4 | R215 |
| NM-019 | Nanoindenter | Download |
Ms. Hsu 7751,7488 |
B3 | R230 |
| NM-020 | Micro-Raman Spectroscopy (Micro-Raman) | Download |
Mr. Yang 7726 |
B3 | R215 |